CVE-2024-53017

Medium CVSS: 6.6

Memory corruption while handling test pattern generator IOCTL command.

Vendor

Product

CWE

Yayın Tarihi

2025-06-03 06:15:24

Güncelleme

2025-08-20 20:24:55

Source Identifier

product-security@qualcomm.com

KEV Date Added

CWE-823 Sdm429w Firmware MEDIUM Qualcomm 2025

https://docs.qualcomm.com/product/publicresources/securitybulletin/june-2025-bulletin.html

High

CVE-2026-21385

Memory corruption while using alignments for memory allocation.

High

CVE-2025-59600

Memory Corruption when adding user-supplied data without checking available buffer space.

High

CVE-2025-59603

Memory Corruption when processing invalid user address with nonstandard buffer address.

High

CVE-2025-47385

Memory Corruption when accessing trusted execution environment without proper privilege check.

High

CVE-2025-47386

Memory Corruption while invoking IOCTL calls when concurrent access to shared buffer occurs.

High

CVE-2025-47381

Memory Corruption while processing IOCTL calls when concurrent access to shared buffer occurs.